HAM Equipment, Inc.


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Products > SEM / TEM Microscopes

SEM and TEM microscopes and components

Working JEOL JSM 5400 Scanning Electron Microscope
"Specifications * Resolution: 4nm * Accelerating voltage: 0.5 to 30kV * Magnification: x15 to 200,000 * Stage: X=80mm, Y=40mm Details The scanning electron microscope is an instrument which uses a lens system to focus electrons generated from an electron gun to a fine point at the surface of a conductive sample. The focused bea...read details price: $14,280